Peer Review History: Improved YOLO Series Models for Automated Photovoltaic Panel Defect Detection

Editor(s):

(1) Prof. Hasan Köten, Istanbul Medeniyet University, Türkiye.

(2) Prof. Huan-Liang Tsai, Da-Yeh University, Taiwan, R.O.C.

Reviewers:

(1) Kulvinder Singh, Baba Farid College of Engineering & Technology, India.

(2) Vinaya Kulkarni, ITM Skills University, India.

(3) Qusay Kanaan Kadhim, Bilad Alrafidain University College, Iraq.

Additional Reviewers:

(1) Awanish Rajput, Mangalayatan University, India.

(2) Azem Hysa, Aleksander Moisiu University, Albania.

(3) Edy Haryanto, Universitas Potensi Utama, Indonesia.

(4) Lotfi Ezzeddini, Tunisia.

(5) Botlagunta Preethish Nandan, USA.

Open Peer Review Policy: Click Here

Specific Comment:

Average Peer review marks at initial stage: 7.625/10

Average Peer review marks at publication stage: 9/10

Peer Review History:


Stage 1 | Original Manuscript | File 1 | NA


Stage 2 | Peer Review Report_1 (Kulvinder Singh, India) | File 1 | NA


Stage 2 | Peer Review Report_2 (Vinaya Kulkarni, India) | File 1 | NA


Stage 2 | Peer Review Report_3 (Qusay Kanaan Kadhim, Iraq) | File 1 | NA


Stage 2 | Revised_MS_v1_and_Feedback_v1 | File 1 | File 2


Stage 3 | Comment_Editor_1_v1 | File 1 | NA


Stage 3 | Comment_Editor_2_v1 | File 1 | NA


Posted in Review History.