Peer Review History: GAN-Based Data Augmentation and Intelligent Fitting for Small-Sample Regression: A Comprehensive Review

Editor(s):

(1) Prof. Hasan Köten, Istanbul Medeniyet University, Türkiye.

Reviewers:

(1) Dinesh Deckker, Wrexham University, Sri Lanka.

(2) D.William Albert, Bheema Institute Of Technology And Science, India.

(3) Kuyoro Afolashade, Babcock University, Nigeria.

Additional Reviewers:

(1) Dontabhaktuni Jayakumar, Lingayas Institute Of Management and Technology, India.

(2) S. Venkata Rao, Shri Vishnu Engineering College for Women(A), India.

(3) Y. Surekha, Prasad V Potluri Siddhartha Institute of Technology, India.

Open Peer Review Policy: Click Here

Specific Comment:

Average Peer review marks at initial stage: 9.2/10

Average Peer review marks at publication stage: 9.5/10

Peer Review History:


Stage 1 | Original Manuscript | File 1 | NA


Stage 2 | Peer Review Report_1 (Dinesh Deckker, Sri Lanka) | File 1 | NA


Stage 2 | Peer Review Report_2 (D.William Albert, India) | File 1 | NA


Stage 2 | Peer Review Report_3 (Kuyoro Afolashade, Nigeria) | File 1 | NA


Stage 2 | Revised_MS_v1_and_Feedback_v1 | File 1 | File 2


Stage 3 | Comment_Editor_1_v1 | File 1 | NA


Posted in Review History.