Peer Review History: Crystallographic Investigation of PVA@PLA Nanocomposite Film by X-ray Diffraction: Insight from High Resolution TEM

Editor(s):

(1) Dr. Guang Yih Sheu, Chang-Jung Christian University, Taiwan.

Reviewers:

(1) Hagar Fathy Saad Abdelatif Mohamed Forsan, Agricultural Research Centre, Egypt.

(2) A. Ayeshamariam, Bharathidasan University, India.

(3) Asieh Akhoondi, Islamic Azad University, Iran.

(4) Megha K. Kothawade, Guru Gobind Singh College of Engineering & Research Centre, India.

Additional Reviewers:

Additional Reviewers: (Comments received after deadline)

Open Peer Review Policy: Click Here

Specific Comment:

Average Peer review marks at initial stage: 9/10

Average Peer review marks at publication stage: 9.5/10

Peer Review History:


Stage 1 | Original Manuscript | File 1 | NA


Stage 2 | Peer Review Report_1 (Hagar Fathy Saad Abdelatif Mohamed Forsan, Egypt) | File 1 | NA


Stage 2 | Peer Review Report_2 (A. Ayeshamariam, India) | File 1 | NA


Stage 2 | Peer Review Report_3 (Asieh Akhoondi, Iran) | File 1 | NA


Stage 2 | Peer Review Report_4 (Megha K. Kothawade, India) | File 1 | NA


Stage 2 | Revised_MS_v1_and_Feedback_v1 | File 1 | File 2


Stage 3 | Comment_Editor_1_v1 | File 1 | NA


Posted in Review History.