Editor(s):
(1) Dr. Chong Leong, Gan, Micron Technology Inc., Taiwan.
Reviewers:
(1) Maza Tadesse Ketema, Arbaminch University, Ethiopia.
(2) Kamal Fared Almokhalelati, United Arab Emirates.
(3) N R DHINESHBABU, T. JOHN INSTITUTE OF TECHNOLOGY, INDIA.
Additional Reviewers:
(1) Amarjeet Daberao, India.
(2) Ashok Chinthakuntla, India.
(3) Felipe Mendonça Fontes Galvão, Federal University of Rio Grande do Norte, Brazil.
(4) Soleiman Mosleh, Yasouj University, Iran.
Open Peer Review Policy: Click Here
Specific Comment:
Average Peer review marks at initial stage: 7.5/10
Average Peer review marks at publication stage: 9/10
Peer Review History:
Stage 1 | Original Manuscript | File 1 | NA
Stage 2 | Peer Review Report_1 (Maza Tadesse Ketema, Ethiopia) | File 1 | NA
Stage 2 | Peer Review Report_2 (Kamal Fared Almokhalelati, United Arab Emirates) | File 1 | NA
Stage 2 | Peer Review Report_3 (N R DHINESHBABU, INDIA) | File 1 | NA
Stage 2 | Revised_MS_v1_and_Feedback_v1 | File 1 | File 2
Stage 2 | Re-Review report_1_v1 | File 1 | NA
Stage 2 | Re-Review report_3_v1 | File 1 | NA
Stage 2 | Revised_MS_v2_and_Feedback_v2 | File 1 | NA
Stage 2 | Re-Review report_1_v2 | NA | NA
Stage 2 | Re-Review report_3_v2 | File 1 | NA
Stage 3 | Comment_Editor_1_v1 | File 1 | NA