Peer Review History: A Theoretical Framework for Ensuring Safety in Semiconductor Manufacturing through Process Optimization and Risk Assessment

Editor(s):

(1) Dr. Chong Leong, Gan, Director, Micron Technology Inc., Taiwan.

Reviewers:

(1) J. Albino Wins, Holy Cross College, Manonmaniam Sundaranar University, India.
(2) M. Saravanan, Anna University, India.

Additional Reviewers:

Additional Reviewers: (Comments received after deadline)

Open Peer Review Policy: Click Here

Specific Comment:

Average Peer review marks at initial stage: 8.25/10
Average Peer review marks at publication stage: 9/10

Peer Review History:


Stage 1 | Original Manuscript | File 1 | NA


Stage 2 | Peer Review Report_1 (J. Albino Wins, India) | File 1 | NA


Stage 2 | Peer Review Report_2 (M. Saravanan, India) | File 1 | NA


Stage 2 | Revised_MS_v1_and_Feedback_v1 | File 1 | File 2


Stage 3 | Comment_Editor_1_v1 | File 1 | NA


Posted in Review History.