Peer Review History: Simulation and Construction of Radio Frequency Identification (RFID) Based Door Locking System Using Smart Card

Editor(s):

(1) Prof. Francisco Welington de Sousa Lima, Federal University of Piaui, Brazil.

Reviewers:

(1) Veerabhadrappa Algur, Rao Bahadur Y Mahabaleswarappa Engineering College, India.

(2) Yong Wang, University of Aberdeen, China.

Additional Reviewers:

(1) Akinbusola Olushola, Indiana University of Pennsylvania, United States.

(2)  Nur Aifiah Binti Ibrahim, Universiti Teknologi MARA, Malaysia.

(3) Sreeparna Chakrabarti, Kristu Jayanti Deemed to be University, India.

(4) S.Vijaya Peterraj, University Of Madras, LoyolaCollege, India.

(5) Yasir Afaq, SRM University-AP, India.

Open Peer Review Policy: Click Here

Specific Comment:

Average Peer review marks at initial stage: 8.6/10

Average Peer review marks at publication stage: 9/10

Peer Review History:


Stage 1 | Original Manuscript | File 1 | NA


Stage 2 | Peer Review Report_1 (Veerabhadrappa Algur, India) | File 1 | NA


Stage 2 | Peer Review Report_2 (Yong Wang, China) | File 1 | NA


Stage 2 | Revised_MS_v1_and_Feedback_v1 | File 1 | File 2


Stage 3 | Comment_Editor_1_v1 | File 1 | NA


Posted in Review History.