Peer Review History: Transformer-Based and Generative AI Framework for Automated Defect Detection in Semiconductor Wafer Inspection

Editor(s):

(1) Prof. Grzegorz Golanski, Czestochowa University of Technology, Poland.

Reviewers:

(1) Muhammad Johirul Islam, United International University, Bangladesh.

(2) Meriem Benaida, University Ferhat Abbas of Setif 1, Algeria.

Additional Reviewers:

(1) Hassanein S. Suhail, Iraq.

(2) Mehran Hosseinzadeh Dizaj, Islamic Azad Tehran University, Iran.

(3) Omamoke O. E. Enaroseha, Delta State University, Nigeria.

(4) Roshan Chitranshi, United College Of Engineering And Research, India.

Open Peer Review Policy: Click Here

Specific Comment:

Average Peer review marks at initial stage: 8/10

Average Peer review marks at publication stage: 9/10

Peer Review History:


Stage 1 | Original Manuscript | File 1 | NA


Stage 2 | Peer Review Report_1 (Muhammad Johirul Islam, Bangladesh) | File 1 | NA


Stage 2 | Peer Review Report_2 (Meriem Benaida, Algeria) | File 1 | NA


Stage 2 | Revised_MS_v1_and_Feedback_v1 | File 1 | File 2


Stage 3 | Comment_Editor_1_v1 | File 1 | NA


Posted in Review History.