Peer Review History: Comparative Analysis of Fully Convolutional Networks (FCN), SegNet, and U-Net for Semantic Segmentation of Synthetic Wafer Map Defect Patterns

Editor(s):

(1) Dr. Chunhua Zhou, Yangzhou University, China.

Reviewers:

(1) Keshetti Sreekala, Mahatma Gandhi Institute of Technology, India.

(2) Ashiq VM, University of Calicut, India.

(3) Aravalli Sainath Chaithanya, Rajiv Gandhi University of Knowledge Technologies, India.

Additional Reviewers:

(1) Bindu Madhavi Tummala, Siddhartha academy of Higher Education, a Deemed to be university, India.

Open Peer Review Policy: Click Here

Specific Comment:

Average Peer review marks at initial stage: 7.9/10

Average Peer review marks at publication stage: 9/10

Peer Review History:


Stage 1 | Original Manuscript | File 1 | NA


Stage 2 | Peer Review Report_1 (Keshetti Sreekala, India) | File 1 | NA


Stage 2 | Peer Review Report_2 (Ashiq VM, India) | File 1 | NA


Stage 2 | Peer Review Report_3 (Aravalli Sainath Chaithanya, India) | File 1 | NA


Stage 2 | Revised_MS_v1_and_Feedback_v1 | File 1 | File 2


Stage 3 | Comment_Editor_1_v1 | File 1 | NA


Posted in Review History.